Focused Ion Beam - Field-emission microscopy (FIB-FESEM)

Measurement methods: SEM, STEM, EBSD, EDX

Firma: FEI
Modell: Nanolab 600

Responsible
Rene Gustus
Telefon: +49-5323-72-3346
E-Mail: rene.gustus@tu-clausthal.de

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Focused Ion Beam - Field-emission microscopy (FIB-FESEM)

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Focused Ion Beam - Field-emission microscopy (FIB-FESEM)